Markov random field modeling in image analysis Stan Z. Li

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Series: Advances in Pattern RecognitionPublication details: New York Springer 2009Edition: 3rd edDescription: xxiii, 357 p ill.; tab 24 cmISBN:

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Carti	IMAR	II 36139 (Browse shelf(Opens below))	1	Checked out	12/29/2026	0015065

eng

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