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1.
Markov random field modeling in image analysis Stan Z. Li by Series: Advances in Pattern Recognition
Edition: 3rd ed.
Publication details: New York Springer 2009
Availability: Not available: IMAR: Checked out (1).

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2.
Support vector machines for pattern classification Shigeo Abe by Series: Advances in pattern recognition
Edition: 2nd ed.
Publication details: London Springer-Verlag London Limited 2010
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