TY  - GEN
AU  - Li,Stan Z
TI  - Markov random field modeling in image analysis
T2  - Advances in Pattern Recognition
SN  - 9781848002784
U1  - 621.36701519233 	 
PY  - 2009///
CY  - New York
PB  - Springer
KW  - Modeling problems
KW  - Markov random field
N1  - Cuprinde Bibliografie si Index
ER  -