Li, Stan Z <br/><br/>
Markov random field modeling in image analysis 
Stan Z. Li 
 - 3rd ed. 
 - New York  Springer  2009 
 - xxiii, 357 p  ill.; tab  24 cm 
 - Advances in Pattern Recognition  16177916 .
<br/><br/> Cuprinde Bibliografie si Index 
<br/><br/><br/>eng 
<br/><br/><label>ISBN: </label>9781848002784 
<br/><br/><label>LCCN: </label>2008943235 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Modeling problems<br/>Markov random field
<br/><br/><label>Dewey Class. No.: </label>621.36701519233 	 006.4