Amazon cover image
Image from Amazon.com

Markov random field modeling in image analysis Stan Z. Li

By: Series: Advances in Pattern RecognitionPublication details: New York Springer 2009Edition: 3rd edDescription: xxiii, 357 p ill.; tab 24 cmISBN:
  • 9781848002784
Subject(s): DDC classification:
  • 621.36701519233
  • 006.4
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)

Powered by Koha